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1 features ? single 2.7v - 3.6v supply ? serial interface architecture ? page program operation C single cycle reprogram (erase and program) C 2048 pages (264 bytes/page) main memory ? two 264-byte sram data buffers C allows receiving of data while reprogramming of non-volatile memory ? internal program and control timer ? fast page program time C 7 ms typical ? 120 m m m m s typical page to buffer transfer time ? low power dissipation C 4 ma active read current typical C8 m m m m a cmos standby current typical ? 5 mhz max clock frequency ? hardware data protection feature ? serial peripheral interface (spi) compatible C modes 0 and 3 ? cmos and ttl compatible inputs and outputs ? commercial and industrial temperature ranges description the at45db041 is a 2.7-volt only, serial interface flash memory suitable for in-sys- tem reprogramming. its 4,325,376 bits of memory are organized as 2048 pages of 264-bytes each. in addition to the main memory, the at45db041 also contains two sram data buffers of 264-bytes each. the buffers allow receiving of data while a page in the main memory is being reprogrammed. unlike conventional flash memo- ries that are accessed randomly with multiple address lines and a parallel interface, the dataflash uses a serial interface to sequentially access its data. the simple serial interface facilitates hardware layout, increases system reliability, minimizes switching 4-megabit 2.7-volt only serial dataflash ? at45db041 rev. 0669dC07/98 pin configurations pin name function cs chip select sck serial clock si serial input so serial output wp hardware page write protect pin reset chip reset rdy/busy ready/busy plcc 5 6 7 8 9 10 11 12 13 29 28 27 26 25 24 23 22 21 sck si so nc nc nc nc nc nc wp reset rdy/busy nc nc nc nc nc nc 4 3 2 1 32 31 30 14 15 16 17 18 19 20 nc nc dc dc nc nc nc cs nc nc gnd vcc nc nc tsop top view ty p e 1 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 rdy/busy reset wp nc nc vcc gnd nc nc nc cs sck si so nc nc nc nc nc nc nc nc nc nc nc nc nc nc soic 1 2 3 4 5 6 7 8 9 10 11 12 13 14 28 27 26 25 24 23 22 21 20 19 18 17 16 15 gnd nc nc cs sck si so nc nc nc nc nc nc nc vcc nc nc wp reset rdy/busy nc nc nc nc nc nc nc nc cbga top view through package a b c d e 1 2345 nc nc nc nc nc vcc wp reset nc nc gnd rdy/bsy si nc nc sck cs so nc nc nc nc nc nc (continued) note: plcc package pins 16 and 17 are dont connect.
at45db041 2 noise, and reduces package size and active pin count. the device is optimized for use in many commercial and indus- trial applications where high density, low pin count, low voltage, and low power are essential. typical applications for the dataflash are digital voice storage, image storage, and data storage. the device operates at clock frequencies up to 5 mhz with a typical active read current consumption of 4 ma. to allow for simple in-system reprogrammability, the at45db041 does not require high input voltages for pro- gramming. the device operates from a single power sup- ply, 2.7v to 3.6v, for both the program and read operations. the at45db041 is enabled through the chip select pin (cs ) and accessed via a three-wire interface consisting of the serial input (si), serial output (so), and the serial clock (sck). all programming cycles are self-timed, and no separate erase cycle is required before programming. block diagram device operation the device operation is controlled by instructions from the host processor. the list of instructions and their associated opcodes are contained in table 1 and table 2. a valid instruction starts with the falling edge of cs followed by the appropriate 8-bit opcode and the desired buffer or main memory address location. while the cs pin is low, toggling the sck pin controls the loading of the opcode and the desired buffer or main memory address location through the si (serial input) pin. all instructions, addresses, and data are transferred with the most significant bit (msb) first. read by specifying the appropriate opcode, data can be read from the main memory or from either one of the two data buffers. main memory page read: a main memory read allows the user to read data directly from any one of the 2048 pages in the main memory, bypassing both of the data buff- ers and leaving the contents of the buffers unchanged. to start a page read, the 8-bit opcode, 52h, is followed by 24 address bits and 32 dont care bits. in the at45db041, the first four address bits are reserved for larger density devices (see notes on page 8), the next 11 address bits (pa10-pa0) specify the page address, and the next nine address bits (ba8-ba0) specify the starting byte address within the page. the 32 dont care bits which follow the 24 address bits are sent to initialize the read operation. fol- lowing the 32 dont care bits, additional pulses on sck result in serial data being output on the so (serial output) pin. the cs pin must remain low during the loading of the opcode, the address bits, and the reading of data. when the end of a page in main memory is reached during a main memory page read, the device will continue reading at the beginning of the same page. a low to high transition on the cs pin will terminate the read operation and tri-state the so pin. buffer read: data can be read from either one of the two buffers, using different opcodes to specify which buffer to read from. an opcode of 54h is used to read data from buffer 1, and an opcode of 56h is used to read data from buffer 2. to perform a buffer read, the eight bits of the opcode must be followed by 15 dont care bits, nine address bits, and eight don't care bits. since the buffer size is 264-bytes, nine address bits (bfa8-bfa0) are required to specify the first byte of data to be read from the buffer. flash memory array page (264 bytes) buffer 2 (264 bytes) buffer 1 (264 bytes) i/o interface sck cs reset v cc gnd rdy/busy wp so si
at45db041 3 the cs pin must remain low during the loading of the opcode, the address bits, the dont care bits, and the read- ing of data. when the end of a buffer is reached, the device will continue reading back at the beginning of the buffer. a low to high transition on the cs pin will terminate the read operation and tri-state the so pin. main memory page to buffer transfer: a page of data can be transferred from the main memory to either buffer 1 or buffer 2. an 8-bit opcode, 53h for buffer 1 and 55h for buffer 2, is followed by the four reserved bits, 11 address bits (pa10-pa0) which specify the page in main memory that is to be transferred, and nine dont care bits. the cs pin must be low while toggling the sck pin to load the opcode, the address bits, and the dont care bits from the si pin. the transfer of the page of data from the main memory to the buffer will begin when the cs pin transitions from a low to a high state. during the transfer of a page of data (t xfr ), the status register can be read to determine whether the transfer has been completed or not. main memory page to buffer compare: a page of data in main memory can be compared to the data in buffer 1 or buffer 2. an 8-bit opcode, 60h for buffer 1 and 61h for buffer 2, is followed by 24 address bits consisting of the four reserved bits, 11 address bits (pa10-pa0) which spec- ify the page in the main memory that is to be compared to the buffer, and nine don't care bits. the loading of the opcode and the address bits is the same as described pre- viously. the cs pin must be low while toggling the sck pin to load the opcode, the address bits, and the don't care bits from the si pin. on the low to high transition of the cs pin, the 264 bytes in the selected main memory page will be compared with the 264 bytes in buffer 1 or buffer 2. during this time (t xfr ), the status register will indicate that the part is busy. on completion of the compare operation, bit 6 of the status register is updated with the result of the com- pare. program buffer write: data can be shifted in from the si pin into either buffer 1 or buffer 2. to load data into either buffer, an 8-bit opcode, 84h for buffer 1 or 87h for buffer 2, is followed by 15 don't care bits and nine address bits (bfa8-bfa0). the nine address bits specify the first byte in the buffer to be written. the data is entered following the address bits. if the end of the data buffer is reached, the device will wrap around back to the beginning of the buffer. data will continue to be loaded into the buffer until a low to high transition is detected on the cs pin. buffer to main memory page program with built-in erase: data written into either buffer 1 or buffer 2 can be programmed into the main memory. an 8-bit opcode, 83h for buffer 1 or 86h for buffer 2, is followed by the four reserved bits, 11 address bits (pa10-pa0) that specify the page in the main memory to be written, and nine additional don't care bits. when a low to high transition occurs on the cs pin, the part will first erase the selected page in main memory to all 1s and then program the data stored in the buffer into the specified page in the main memory. both the erase and the programming of the page are internally self timed and should take place in a maxi- mum time of t ep . during this time, the status register will indicate that the part is busy. buffer to main memory page program with- out built-in erase: a previously erased page within main memory can be programmed with the contents of either buffer 1 or buffer 2. an 8-bit opcode, 88h for buffer 1 or 89h for buffer 2, is followed by the four reserved bits, 11 address bits (pa10-pa0) that specify the page in the main memory to be written, and nine additional dont care bits. when a low to high transition occurs on the cs pin, the part will program the data stored in the buffer into the specified page in the main memory. it is necessary that the page in main memory that is being programmed has been previ- ously programmed to all 1s (erased state). the program- ming of the page is internally self timed and should take place in a maximum time of t p . during this time, the status register will indicate that the part is busy. main memory page program: this operation is a combination of the buffer write and buffer to main memory page program with built-in erase operations. data is first shifted into buffer 1 or buffer 2 from the si pin and then pro- grammed into a specified page in the main memory. an 8- bit opcode, 82h for buffer 1 or 85h for buffer 2, is followed by the four reserved bits and 20 address bits. the 11 most significant address bits (pa10-pa0) select the page in the main memory where data is to be written, and the next nine address bits (bfa8-bfa0) select the first byte in the buffer to be written. after all address bits are shifted in, the part will take data from the si pin and store it in one of the data buffers. if the end of the buffer is reached, the device will wrap around back to the beginning of the buffer. when there is a low to high transition on the cs pin, the part will first erase the selected page in main memory to all 1s and then program the data stored in the buffer into the specified page in the main memory. both the erase and the program- ming of the page are internally self timed and should take place in a maximum of time t ep . during this time, the status register will indicate that the part is busy. auto page rewrite: this mode is only needed if multi- ple bytes within a page or multiple pages of data are modi- fied in a random fashion. this mode is a combination of two operations: main memory page to buffer transfer and buffer to main memory page program with built-in erase. a page of data is first transferred from the main memory to buffer 1 or buffer 2, and then the same data (from buffer 1 or buffer 2) is programmed back into its original page of main memory. an 8-bit opcode, 58h for buffer 1 or 59h for buffer 2, is followed by the four reserved bits, 11 address
at45db041 4 bits (pa10-pa0) that specify the page in main memory to be rewritten, and nine additional don't care bits. when a low to high transition occurs on the cs pin, the part will first transfer data from the page in main memory to a buffer and then program the data from the buffer back into same page of main memory. the operation is internally self-timed and should take place in a maximum time of t ep . during this time, the status register will indicate that the part is busy. if the main memory is programmed or reprogrammed sequentially page by page, then the programming algo- rithm shown in figure 1 is recommended. otherwise, if multiple bytes in a page or several pages are programmed randomly in the main memory, then the programming algo- rithm shown in figure 2 is recommended. status register: the status register can be used to determine the devices ready/busy status, the result of a main memory page to buffer compare operation, or the device density. to read the status register, an opcode of 57h must be loaded into the device. after the last bit of the opcode is shifted in, the eight bits of the status register, starting with the msb (bit 7), will be shifted out on the so pin during the next eight clock cycles. the five most-signifi- cant bits of the status register will contain device informa- tion, while the remaining three least-significant bits are reserved for future use and will have undefined values. after bit 0 of the status register has been shifted out, the sequence will repeat itself (as long as cs remains low and sck is being toggled) starting again with bit 7. the data in the status register is constantly updated, so each repeating sequence will output new data. ready/busy status is indicated using bit 7 of the status reg- ister. if bit 7 is a 1, then the device is not busy and is ready to accept the next command. if bit 7 is a 0, then the device is in a busy state. the user can continuously poll bit 7 of the status register by stopping sck once bit 7 has been output. the status of bit 7 will continue to be output on the so pin, and once the device is no longer busy, the state of so will change from 0 to 1. there are six operations which can cause the device to be in a busy state: main memory page to buffer transfer, main memory page to buffer compare, buffer to main memory page program with built-in erase, buffer to main memory page program without built-in erase, main memory page program, and auto page rewrite. the result of the most recent main memory page to buffer compare operation is indicated using bit 6 of the status register. if bit 6 is a 0, then the data in the main memory page matches the data in the buffer. if bit 6 is a 1, then at least one bit of the data in the main memory page does not match the data in the buffer. the device density is indicated using bits 5, 4, and 3 of the status register. for the at45db041, the three bits are 0, 1, and 1. the decimal value of these three binary bits does not equate to the device density; the three bits represent a combinational code relating to differing densities of serial dataflash devices, allowing a total of eight different density configurations. read/program mode summary the modes listed above can be separated into two groups modes which make use of the flash memory array (group a) and modes which do not make use of the flash memory array (group b). group a modes consist of: 1. main memory page read 2. main memory page to buffer 1 (or 2) transfer 3. main memory page to buffer 1 (or 2) compare 4. buffer 1 (or 2) to main memory page program with built-in erase 5. buffer 1 (or 2) to main memory page program with- out built-in erase 6. main memory page program 7. auto page rewrite group b modes consist of: 1. buffer 1 (or 2) read 2. buffer 1 (or 2) write 3. status read if a group a mode is in progress (not fully completed) then another mode in group a should not be started. however, during this time in which a group a mode is in progress, modes in group b can be started. this gives the serial dataflash the ability to virtually accommodate a continuous data stream. while data is being programmed into main memory from buffer 1, data can be loaded into buffer 2 (or vice versa). see application note an-4 (using atmels serial dataflash) for more details. hardware page write protect: if the wp pin is held low, the first 256 pages of the main memory cannot be reprogrammed. the only way to reprogram the first 256 pages is to first drive the protect pin high and then use the program commands previously mentioned. status register format bit 7 bit 6 bit 5 bit 4 bit 3 bit 2 bit 1 bit 0 rdy/busy comp0 11xxx
at45db041 5 reset : a low state on the reset pin (reset ) will terminate the operation in progress and reset the internal state machine to an idle state. the device will remain in the reset condition as long as a low level is present on the reset pin. normal operation can resume once the reset pin is brought back to a high level. the device also incorporates an internal power-on reset circuit; therefore, there are no restrictions on the reset pin during power-on sequences. ready/busy : this open drain output pin will be driven low when the device is busy in an internally self-timed oper- ation. this pin, which is normally in a high state (through an external pull-up resistor), will be pulled low during program- ming operations, compare operations, and during page-to- buffer transfers. the busy status indicates that the flash memory array and one of the buffers cannot be accessed; read and write operations to the other buffer can still be performed. power on/reset state when power is first applied to the device, or when recover- ing from a reset condition, the device will default to spi mode 3. in addition, the so pin will be in a high impedance state, and a high to low transition on the cs pin will be required to start a valid instruction. the spi mode will be automatically selected on every falling edge of cs by sam- pling the inactive clock state. note: 1. after power is applied and v cc is at the minimum specified data sheet value, the system should wait 20 ms before an oper- ational mode is started. absolute maximum ratings* temperature under bias................................ -55 c to +125 c *notice: stresses beyond those listed under absolute maximum ratings may cause permanent dam- age to the device. this is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect device reliability. storage temperature ..................................... -65 c to +150 c all input voltages (including nc pins) with respect to ground ...................................-0.6v to +6.25v all output voltages with respect to ground .............................-0.6v to v cc + 0.6v dc and ac operating range at45db041 operating temperature (case) com. 0 c to 70 c ind. -40 c to 85 c v cc power supply (1) 2.7v to 3.6v
at45db041 6 dc characteristics symbol parameter condition min typ max units i sb standby current cs , reset , wp = v ih , all inputs at cmos levels 820 m a i cc1 active current, read operation f = 5 mhz; i out = 0 ma; v cc = 3.6v 4 10 ma i cc2 active current, program/erase operation v cc = 3.6v 15 35 ma i li input load current v in = cmos levels 1 m a i lo output leakage current v i/o = cmos levels 1 m a v il input low voltage 0.6 v v ih input high voltage 2.0 v v ol output low voltage i ol = 1.6 ma; v cc = 2.7v 0.4 v v oh output high voltage i oh = -100 m av cc - 0.2v v ac characteristics symbol parameter min typ max units f sck sck frequency 5mhz t wh sck high time 80 ns t wl sck low time 80 ns t cs minimum cs high time 350 ns t css cs setup time 350 ns t csh cs hold time 350 ns t csb cs high to rdy/busy low 200 ns t su data in setup time 15 ns t h data in hold time 35 ns t ho output hold time 0 ns t dis output disable time 100 ns t v output valid 120 ns t xfr page to buffer transfer/compare time 120 250 m s t ep page erase and programming time 10 20 ms t p page programming time 7 14 ms t rst reset pulse width 10 m s t rec reset recovery time 1 m s input test waveforms and measurement levels t r , t f < 20 ns (10% to 90%) ac driving levels ac measurement level 0.45v 2.0 0.8 2.4v output test load device under test 30 pf
at45db041 7 ac waveforms two different timing diagrams are shown below. waveform 1 shows the sck signal being low when cs makes a high- to-low transition, and waveform 2 shows the sck signal being high when cs makes a high-to-low transition. both waveforms show valid timing diagrams. the setup and hold times for the si signal are referenced to the low-to-high transition on the sck signal. waveform 1 shows timing that is also compatible with spi mode 0, and waveform 2 shows timing that is compatible with spi mode 3. waveform 1 - inactive clock polarity low waveform 2 - inactive clock polarity high cs sck si so tcss valid in th tsu twh twl tcsh tcs tv high impedance valid out tho tdis high impedance cs sck si so tcss valid in th tsu twl twh tcsh tcs tv high z valid out tho tdis high impedance
at45db041 8 reset timing (inactive clock polarity low shown) command sequence for read/write operations (except status register read) notes: 1. r designates bits reserved for larger densities. 2. it is recommended that r be a logical 0 for densities of 4m bit or smaller. 3. for densities larger than 4m bit, the r bits become the most significant page address bit for the appropriate density. cs sck reset so high impedance high impedance si trst trec tcss si cmd 8 bits 8 bits 8 bits msb reserved for larger densities page address (pa10-pa0) byte/buffer address (ba8-ba0/bfa8-bfa0) lsb r r r r x x x x x x x x x x x x x x x x x x x x
at45db041 9 write operations the following block diagram and waveforms illustrate the various write sequences available. main memory page program through buffers buffer write buffer to main memory page program (data from buffer programmed into flash page) flash memory array page (264 bytes) buffer 2 (264 bytes) buffer 1 (264 bytes) i/o interface si buffer 1 to main memory page program main memory page program through buffer 2 buffer 2 to main memory page program main memory page program through buffer 1 buffer 1 write buffer 2 write si cmd n n+1 last byte completes writing into selected buffer starts self-timed erase/program operation cs rrrrr, pa9-7 pa6-0, bfa8 bfa7-0 si cmd x xx, bfa8 bfa7-0 n n+1 last byte completes writing into selected buffer cs si cmd rrrrr, pa9-7 pa6-0, x cs starts self-timed erase/program operation x each transition represents 8 bits and 8 clock c y cles n = 1st byte read n+1 = 2nd byte read
at45db041 10 read operations the following block diagram and waveforms illustrate the various read sequences available. main memory page read main memory page to buffer transfer (data from flash page read into buffer) buffer read flash memory array page (264 bytes) buffer 2 (264 bytes) buffer 1 (264 bytes) i/o interface main memory page to buffer 1 main memory page to buffer 2 main memory page read buffer 1 read buffer 2 read so si cmd rrrrr, pa9-7 pa6-0, ba8 ba7-0 x x x x cs n n+1 so si cmd rrrrr, pa9-7 pa6-0, x x starts reading page data into buffer cs so si cmd x xx, bfa8 bfa7-0 cs n n+1 so x each transition represents 8 bits and 8 clock c y cles n = 1st byte written n+1 = 2nd byte written
at45db041 11 detailed bit-level read timing C inactive clock polarity low main memory page read buffer read status register read si 0 10 10 xxx cs so sck 12345 60 61 62 63 64 65 66 67 xx high-impedance d 7 d 6 d 5 data out command opcode msb tsu tv si 0 10 10 xxx cs so sck 12345 36 37 38 39 40 41 42 43 xx high-impedance d 7 d 6 d 5 data out command opcode msb tsu tv si 0 10 10 111 cs so sck 12345 78910 11 12 16 17 high-impedance d 7 d 6 d 5 status register output command opcode msb tsu tv 6 d 1 d 0 d 7 lsb msb
at45db041 12 detailed bit-level read timing C inactive clock polarity high main memory page read buffer read status register read si 0 10 10 xxx cs so sck 12345 61 62 63 64 65 66 67 xx high-impedance d 7 d 6 d 5 data out command opcode msb tsu tv d 4 68 si 0 10 10 xxx cs so sck 12345 37 38 39 40 41 42 43 xx high-impedance d 7 d 6 d 5 data out command opcode msb tsu tv d 4 44 si 0 10 10 111 cs so sck 12345 78910 11 12 17 18 high-impedance d 7 d 6 d 5 status register output command opcode msb tsu tv 6 d 4 d 0 d 7 lsb msb d 6
at45db041 13 table 1. main memory page read buffer 1 read buffer 2 read main memory page to buffer 1 transfer main memory page to buffer 2 transfer main memory page to buffer 1 compare main memory page to buffer 2 compare buffer 1 write buffer 2 write opcode 52h 54h 56h 53h 55h 60h 61h 84h 87h 000000011 111111100 000001100 111110000 000000000 011010011 101100001 000110101 rxxrrrrxx rxxrrrrxx rxxrrrrxx rxxrrrrxx pa10 x x pa10 pa10 pa10 pa10 x x pa 9 x x pa 9 pa 9 pa 9 pa 9 x x pa 8 x x pa 8 pa 8 pa 8 pa 8 x x pa 7 x x pa 7 pa 7 pa 7 pa 7 x x pa 6 x x pa 6 pa 6 pa 6 pa 6 x x pa 5 x x pa 5 pa 5 pa 5 pa 5 x x pa 4 x x pa 4 pa 4 pa 4 pa 4 x x pa 3 x x pa 3 pa 3 pa 3 pa 3 x x pa 2 x x pa 2 pa 2 pa 2 pa 2 x x pa 1 x x pa 1 pa 1 pa 1 pa 1 x x pa 0 x x pa 0 pa 0 pa 0 pa 0 x x ba8bfa8bfa8xxxxbfa8bfa8 ba7bfa7bfa7xxxxbfa7bfa7 ba6bfa6bfa6xxxxbfa6bfa6 ba5bfa5bfa5xxxxbfa5bfa5 ba4bfa4bfa4xxxxbfa4bfa4 ba3bfa3bfa3xxxxbfa3bfa3 ba2bfa2bfa2xxxxbfa2bfa2 ba1bfa1bfa1xxxxbfa1bfa1 ba0bfa0bfa0xxxxbfa0bfa0 xxx x (dont care) r (reserved bits) xxx xxx xxx xxx xxx xxx xxx ? ? ? x (64th bit)
at45db041 14 x (dont care) r (reserved bits) table 2. buffer 1 to main memory page program with built-in erase buffer 2 to main memory page program with built-in erase buffer 1 to main memory page program without built-in erase buffer 2 to main memory page program without built-in erase main memory page program through buffer 1 main memory page program through buffer 2 auto page rewrite through buffer 1 auto page rewrite through buffer 2 status register opcode 83h 86h 88h 89h 82h 85h 58h 59h 57h 11111100 0 00000011 1 00000000 0 00000011 1 00110011 0 01000100 1 11001000 1 10010101 1 rrrrrrrr rrrrrrrr rrrrrrrr rrrrrrrr pa 1 0 pa 1 0 pa 1 0 pa 1 0 pa 1 0 pa 1 0 pa 1 0 pa 1 0 pa 9 pa 9 pa 9 pa 9 pa 9 pa 9 pa 9 pa 9 pa 8 pa 8 pa 8 pa 8 pa 8 pa 8 pa 8 pa 8 pa 7 pa 7 pa 7 pa 7 pa 7 pa 7 pa 7 pa 7 pa 6 pa 6 pa 6 pa 6 pa 6 pa 6 pa 6 pa 6 pa 5 pa 5 pa 5 pa 5 pa 5 pa 5 pa 5 pa 5 pa 4 pa 4 pa 4 pa 4 pa 4 pa 4 pa 4 pa 4 pa 3 pa 3 pa 3 pa 3 pa 3 pa 3 pa 3 pa 3 pa 2 pa 2 pa 2 pa 2 pa 2 pa 2 pa 2 pa 2 pa 1 pa 1 pa 1 pa 1 pa 1 pa 1 pa 1 pa 1 pa 0 pa 0 pa 0 pa 0 pa 0 pa 0 pa 0 pa 0 xxxxba8ba8xx xxxxba7ba7xx xxxxba6ba6xx xxxxba5ba5xx xxxxba4ba4xx xxxxba3ba3xx xxxxba2ba2xx xxxxba1ba1xx xxxxba0ba0xx
at45db041 15 figure 1. algorithm for programming or reprogramming of the entire array sequentially notes: 1. this type of algorithm is used for applications in which the entire array is programmed sequentially, filling the array page-by- page. 2. a page can be written using either a main memory page program operation or a buffer write operation followed by a buffer to main memory page program operation. 3. the algorithm above shows the programming of a single page. the algorithm will be repeated sequentially for each page within the entire array. start main memory page program (82h, 85h) end provide address and data buffer write (84h, 87h) buffer to main memory page program (83h, 86h)
at45db041 16 figure 2. algorithm for randomly modifying data notes: 1. to preserve data integrity, each page of the dataflash memory array must be updated/rewritten at least once within ever y 10,000 cumulative page erase/program operations. 2. a page address pointer must be maintained to indicate which page is to be rewritten. the auto page rewrite command must use the address specified by the page address pointer. 3. other algorithms can be used to rewrite portions of the flash array. low power applications may choose to wait until 10,000 cumulative page erase/program operations have accumulated before rewriting all pages of the flash array. see application note an-4 (using atmels serial dataflash) for more details. start main memory page to buffer transfer (53h, 55h) increment page address pointer (2) auto page rewrite (2) (58h, 59h) end provide address of page to modify if planning to modify multiple bytes currently stored within a page of the flash array main memory page program (82h, 85h) buffer write (84h, 87h) buffer to main memory page program (83h, 86h)
at45db041 17 ordering information f sck (mhz) i cc (ma) ordering code package operation range active standby 5 10 0.02 AT45DB041-JC at45db041-rc at45db041-tc at45db041-cc 32j 28r 28t 24c1 commercial (0 c to 70 c) 5 10 0.02 at45db041-ji at45db041-ri at45db041-ti at45db041-ci 32j 28r 28t 24c1 industrial (-40 c to 85 c) package type 32j 32-lead, plastic j-leaded chip carrier package (plcc) 28r 28-lead, 0.330" wide, plastic gull-wing small outline package (soic) 28t 28-lead, plastic thin small outline package (tsop) 24c1 24-ball, 5 x 5 array plastic chip-scale ball grid array (cbga)
at45db041 18 packaging information .045(1.14) x 45 pin no. 1 identify .025(.635) x 30 - 45 .012(.305) .008(.203) .021(.533) .013(.330) .530(13.5) .490(12.4) .030(.762) .015(3.81) .095(2.41) .060(1.52) .140(3.56) .120(3.05) .032(.813) .026(.660) .050(1.27) typ .553(14.0) .547(13.9) .595(15.1) .585(14.9) .300(7.62) ref .430(10.9) .390(9.90) at contact points .022(.559) x 45 max (3x) .453(11.5) .447(11.4) .495(12.6) .485(12.3) *controlling dimension: millimeters a b c d e 54321 4.0 (0.157) 1.12 (0.044) 0.86 (0.034) 0.46 (0.018) dia ball typ 2.12 (0.083) 1.86 (0.073) 4.0 (0.157) 8.2 (0.323) 7.8 (0.307) 1.40 (0.055) max 0.30 (0.012) 6.2 (0.244) 5.8 (0.228 ) 1.00 (0.039) bsc non-accumulative 32j, 32-lead, plastic j-leaded chip carrier (plcc) dimensions in inches and (millimeters) jedec standard ms-016 ae 28r, 28-lead, 0.330" wide, plastic gull wing small outline (soic) dimensions in inches and (millimeters) 28t, 28-lead, plastic thin small outline package (tsop) dimensions in millimeters and (inches)* 24c1, 24-ball (5 x 5 array) 1.0mm pitch 8 x 6 mm plastic chip-scale ball grid array (cbga) dimensions in millimeters and (inches)

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